Toward electrically controllable read
Transkrypt
Toward electrically controllable read
Magneto-resistive memory in cross-like (Ga,Mn)As nanostructures T. Andrearczyk 1, I. Krogulec 1,2, T. Wosiński 1, T. Figielski 1, A. Mąkosa 1, J. Wróbel 1 and J. Sadowski 1,3 1 2 Institute of Physics, Polish Academy of Sciences, 02-668 Warsaw, Poland College of Science, Cardinal S. Wyszynski University, 01-815 Warsaw, Poland 3 MAX-Lab, Lund University, 22100 Lund, Sweden We present our results [14] of magnetoresistance (MR) measurements carried out for crosslike nanostructures fabricated from p-type Ga0.94Mn0.06As ferromagnetic film, that is 20 nm thick. The nanostructures’ pattern, as prepared by electron-beam lithography technique, consists of two perpendicularly crossed nanowires, each of them having about 200 nm width and 2 µm length. The MR of such nanostructures exhibits the hysteresis-like behaviour and related remnant resistance effect in zero magnetic field, which has been explained as due to contribution of the magnetic domain walls (DWs) pinned at the intersection of the nanowires. Basically, we show here an effect of DWs’ magnetic angle on the remnant resistance of the nanowires, observed in regime of relatively low magnetic fields up to 100 Oe. We fabricated a series of the cross-like nanostructures tilted by different angles: 0, 20 and 45 deg, with respect to the 100 crystallographic axes. A pronounced enhancement of the DWs’ contribution to the resistance was observed for the 20 deg. Additionally, we show the MR results in higher field range, up to 1 kOe, which allowed us for determining so called lithography-induced anisotropy field. Its value, although depending on the tilt angle, is much higher than the in-plane magnetic anisotropy field of the (Ga,Mn)As film, thus indicating the DWs pinning mechanism as resulting from the competition between two anisotropies: the magneto-crystalline and the lithography-induced one. We also discuss the contribution of anisotropic magneto-resistance to the observed magneto-resistive memory effect and interpret the effect in terms of DWs rearrangement in the nanostructures. This work has been partially supported by the Polish Ministry of Science and Higher Education under Grant No. N N202 129339. [1] T. Andrearczyk, T. Wosinski, T. Figielski, A. Makosa, I. Krogulec, J. Wróbel, and J. Sadowski, Phys. Status Solidi B 248, 1587 (2011). [2] T. Andrearczyk, T. Wosiński, A. Mąkosa, T. Figielski, J. Wróbel, and J. Sadowski, Acta Phys. Pol. A 116, 901 (2009). [3] T. Andrearczyk, T. Wosiński, T. Figielski, A. Mąkosa, J. Sadowski, Z. Tkaczyk, E. Łusakowska, and J. Wróbel, Acta Phys. Pol. A 114, 1049 (2008). [4] T. Figielski, T. Wosiński, A. Morawski, A. Mąkosa, J. Wróbel, and J. Sadowski, Appl. Phys. Lett. 90, 052108 (2007).